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reko
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Name
Complexity
Churn
Issues
A
src\UnitTests\Arch\MilStd1750\MilStd1750DisassemblerTests.cs
4 3 5
A
src\Arch\MicroBlaze\MicroBlazeDisassembler.cs
10 6 5
A
src\UnitTests\Arch\Motorola\M68k\RewriterTests.cs
0 2 5
A
src\Arch\CompactRisc\Cr16cDisassembler.cs
41 5 5
A
src\Arch\Qualcomm\HexagonRewriter.cs
86 10 5
A
src\UnitTests\Arch\V850\V850DisassemblerTests.cs
2 3 5
A
src\UnitTests\Arch\X86\Disassembler\X86DisassemblerTests.cs
11 10 5
A
src\UnitTests\Arch\X86\Rewriter\X86Rewriter_32bitTests.cs
0 5 5
A
src\UnitTests\Arch\zSeries\zSeriesRewriterTests.cs
0 3 5
A
src\Arch\Renesas\Rx\RxRewriter.cs
29 6 5
A
src\UnitTests\Core\Collections\SortedListExTests.cs
3 3 5
A
src\Arch\Microchip\Common\PICArchitectureOptions.cs
7 4 5
A
src\Arch\Microchip\Common\PICDeviceConfigDefs.cs
17 5 5
A
src\Arch\Microchip\Common\PICMemoryDescriptor.cs
7 5 5
A
src\Arch\Sanyo\LC8670Disassembler.cs
33 5 5
A
src\Arch\Sparc\Registers.cs
5 4 5
A
src\Arch\Microchip\Common\PICRegisterBitFieldStorage.cs
7 4 5
A
src\Arch\Epson\C33Disassembler.cs
18 3 5
A
src\Arch\Microchip\PIC16\Enhanced\PIC16EnhdDisasm.cs
13 4 5
A
src\Decompiler\Analysis\LinearInductionVariableFinder.cs
90 7 5