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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\usecase\usecase_test.go
4 5 -
A
usecases\usecase\testhelper_test.go
4 8 -
A
usecases\ma\mgcp\testhelper_test.go
4 6 -
A
usecases\cem\opev\events_test.go
4 4 1
A
features\internal\deviceclassification_test.go
4 2 -
A
usecases\internal\helper_test.go
4 2 -
A
features\client\deviceclassification_test.go
4 3 -
A
features\internal\devicediagnosis_test.go
4 3 -
A
usecases\cem\evsoc\testhelper_test.go
4 8 -
A
usecases\cem\evsecc\testhelper_test.go
4 8 -
A
usecases\cem\vapd\public_test.go
3 3 -
A
usecases\cem\cevc\events_test.go
3 4 -
A
features\server\helper_test.go
3 3 1
A
usecases\cem\oscev\events_test.go
3 4 1
A
usecases\cem\vabd\events_test.go
3 4 1
A
integration_tests\emobility_measurement_test.go
3 9 -
A
usecases\usecase\events_test.go
3 4 -
A
usecases\internal\testhelper_test.go
3 6 -
A
usecases\internal\manufacturerdata.go
3 2 -
A
usecases\cem\evsecc\events_test.go
3 4 -