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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
features\client\deviceconfiguration.go
10 3 -
A
mocks\ServiceReaderInterface.go
10 6 -
A
usecases\cem\evcc\public_test.go
9 4 -
A
mocks\IdentificationCommonInterface.go
9 3 -
A
features\internal\incentivetable_test.go
9 2 -
A
usecases\eg\lpc\public_test.go
8 6 -
A
features\client\incentivetable_test.go
8 3 -
A
features\client\loadcontrol_test.go
8 5 -
A
usecases\eg\lpp\public_test.go
8 6 -
A
mocks\DeviceDiagnosisCommonInterface.go
8 3 -
A
service\service_hub.go
8 3 -
A
usecases\cem\evsecc\public.go
8 3 -
A
usecases\cem\evcem\public_test.go
7 7 -
A
features\client\electricalconnection_test.go
7 3 -
A
features\server\electricalconnection_test.go
7 5 -
A
usecases\cem\evcc\events_test.go
7 4 -
A
usecases\cem\evsoc\public.go
7 2 -
A
features\client\timeseries.go
7 2 -
A
features\client\timeseries_test.go
7 3 -
A
mocks\EntityEventCallback.go
7 2 -