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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\oscev\events_test.go
3 4 1
A
usecases\cem\cevc\public_scen1_test.go
2 3 -
A
usecases\cem\cevc\public_scen4_test.go
2 3 -
A
usecases\cem\cevc\public_scen58_test.go
2 1 -
A
usecases\cem\evsecc\public_test.go
2 3 -
A
mocks\DeviceDiagnosisServerInterface.go
2 4 -
A
usecases\ma\mgcp\usecase_test.go
1 1 -
A
usecases\ma\mgcp\usecase.go
1 4 -
A
usecases\internal\manufacturerdata_test.go
1 2 -
A
usecases\internal\deviceconfiguration_test.go
1 1 -
A
usecases\eg\lpp\usecase_test.go
1 3 -
A
usecases\eg\lpp\usecase.go
1 6 -
A
usecases\eg\lpc\usecase_test.go
1 3 -
A
usecases\ma\mpc\usecase.go
1 5 -
A
usecases\eg\lpc\usecase.go
1 6 -
A
usecases\cem\cevc\public_test.go
1 3 -
A
usecases\cem\cevc\usecase.go
1 5 -
A
usecases\cem\cevc\usecase_test.go
1 3 -
A
usecases\cem\evcc\results_test.go
1 2 -
A
usecases\cem\evcc\usecase.go
1 4 -