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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\usecase\events_test.go
3 4 -
A
usecases\eg\lpc\usecase.go
3 7 -
A
usecases\internal\manufacturerdata.go
3 2 -
A
usecases\cem\oscev\events_test.go
3 4 1
A
usecases\cem\evsecc\events_test.go
3 4 -
A
usecases\cem\vabd\events_test.go
3 4 1
A
usecases\cem\oscev\usecase.go
3 5 -
A
usecases\cs\lpc\testhelper_test.go
4 9 -
A
features\internal\smartenergymanagementps_test.go
4 2 -
A
usecases\eg\lpp\testhelper_test.go
4 11 -
A
features\server\devicediagnosis.go
4 2 -
A
features\client\identification_test.go
4 3 -
A
usecases\cem\opev\events_test.go
4 4 1
A
usecases\cem\cevc\testhelper_test.go
4 9 -
A
usecases\cs\lpp\testhelper_test.go
4 9 -
A
usecases\cem\vapd\testhelper_test.go
4 9 -
A
usecases\cem\evcc\testhelper_test.go
4 8 -
A
usecases\cem\evcem\events_test.go
4 4 -
A
usecases\ma\mdt\testhelper_test.go
4 1 -
A
usecases\internal\helper_test.go
4 2 -