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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
features\client\deviceclassification_test.go
4 3 -
A
usecases\cem\vapd\events_test.go
4 4 1
A
usecases\cem\vabd\testhelper_test.go
4 9 -
A
usecases\eg\lpc\testhelper_test.go
4 9 -
A
usecases\cs\lpc\events_test.go
4 5 3
A
usecases\usecase\usecase_test.go
4 5 -
A
usecases\eg\lpp\testhelper_test.go
4 9 -
A
usecases\cs\lpc\testhelper_test.go
4 8 -
A
usecases\cem\vapd\testhelper_test.go
4 8 -
A
usecases\cem\opev\testhelper_test.go
5 9 -
A
usecases\cem\cevc\public_scen2_test.go
5 3 -
A
usecases\cem\oscev\testhelper_test.go
5 9 -
A
features\client\measurement.go
5 2 -
A
integration_tests\cs_deviceconfiguration_approval_test.go
5 1 -
A
mocks\DeviceClassificationClientInterface.go
5 3 -
A
usecases\eg\lpp\events_test.go
5 6 2
A
mocks\DeviceClassificationCommonInterface.go
5 3 -
A
examples\remote\ucs.go
5 2 -
A
mocks\IdentificationClientInterface.go
5 3 -
A
features\internal\identification_test.go
5 2 -