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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
mocks\DeviceDiagnosisServerInterface.go
2 4 -
A
api\configuration_test.go
2 9 -
A
usecases\cem\cevc\public_scen1_test.go
2 3 -
A
usecases\cem\cevc\public_scen4_test.go
2 3 -
A
usecases\cem\evsecc\usecase.go
3 3 -
A
features\server\helper_test.go
3 3 1
A
usecases\cem\oscev\usecase.go
3 3 -
A
usecases\cem\vabd\events_test.go
3 4 1
A
integration_tests\emobility_measurement_test.go
3 9 -
A
usecases\cem\evcc\usecase.go
3 3 -
A
usecases\internal\manufacturerdata.go
3 2 -
A
usecases\cem\vabd\usecase.go
3 4 -
A
usecases\cem\opev\usecase.go
3 3 -
A
usecases\cem\evcem\usecase.go
3 3 -
A
usecases\cem\evsecc\events_test.go
3 4 -
A
usecases\cs\lpp\usecase_test.go
3 3 -
A
usecases\cem\cevc\usecase.go
3 4 -
A
usecases\cem\cevc\events_test.go
3 4 -
A
usecases\cem\evsoc\events_test.go
3 4 -
A
usecases\eg\lpc\usecase.go
3 5 -