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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\oscev\usecase_test.go
1 3 -
A
usecases\cem\evsoc\usecase_test.go
1 3 -
A
usecases\cem\evsecc\usecase_test.go
1 3 -
A
usecases\cem\evsoc\public_test.go
1 3 -
A
usecases\cem\evcc\results_test.go
1 2 -
A
usecases\internal\manufacturerdata_test.go
1 2 -
A
usecases\cem\evcc\usecase_test.go
1 3 -
A
usecases\ma\mpc\usecase_test.go
1 3 -
A
usecases\ma\mgcp\usecase_test.go
1 1 -
A
usecases\internal\measurement_test.go
1 4 1
A
usecases\cem\opev\usecase_test.go
1 3 -
A
usecases\eg\lpp\usecase_test.go
1 3 -
A
usecases\eg\lpc\usecase_test.go
1 3 -
A
usecases\cem\vapd\usecase_test.go
1 3 -
A
usecases\cem\evcem\usecase_test.go
1 3 -
A
api\usecases_test.go
1 1 -
A
usecases\cem\vabd\usecase_test.go
1 3 -
A
usecases\cem\cevc\public_test.go
1 3 -
A
api\configuration_test.go
2 9 -
A
usecases\cem\cevc\public_scen1_test.go
2 3 -