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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
features\server\devicediagnosis_test.go
 6 -
A
features\server\electricalconnection_test.go
 6 -
A
usecases\mocks\CsLPPInterface.go
55 6 -
A
usecases\mocks\CsLPCInterface.go
55 6 -
A
usecases\eg\lpp\types.go
 6 -
A
usecases\cem\evcem\events.go
37 6 -
A
usecases\internal\testhelper_test.go
3 6 -
A
usecases\cem\evcc\events.go
66 6 -
A
features\server\measurement_test.go
 6 -
A
usecases\ma\mgcp\events.go
46 6 1
A
usecases\cem\cevc\events.go
62 6 -
A
usecases\cem\vapd\events.go
40 6 1
A
usecases\cem\vabd\events.go
31 6 -
A
usecases\ma\mgcp\testhelper_test.go
4 6 -
A
usecases\eg\lpp\usecase.go
1 6 -
A
features\server\loadcontrol_test.go
 6 -
A
usecases\api\eg_lpp.go
 6 -
A
features\client\feature.go
27 5 -
A
features\client\feature_test.go
 5 -
A
features\server\deviceconfiguration_test.go
 5 -