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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\evcem\usecase_test.go
1 3 -
A
mocks\DeviceConfigurationCommonInterface.go
28 3 -
A
usecases\cem\evsecc\public.go
8 3 -
A
usecases\cem\oscev\types.go
 3 -
A
mocks\DeviceConfigurationServerInterface.go
42 3 -
A
usecases\cem\evsecc\public_test.go
2 3 -
A
usecases\cem\evsecc\types.go
 3 -
A
mocks\DeviceDiagnosisClientInterface.go
10 3 -
A
usecases\cem\evsecc\usecase.go
3 3 -
A
mocks\DeviceDiagnosisCommonInterface.go
8 3 -
A
usecases\cem\evsecc\usecase_test.go
1 3 -
A
usecases\cs\lpp\usecase_test.go
3 3 -
A
features\client\timeseries_test.go
7 3 -
A
usecases\cem\oscev\usecase.go
3 3 -
A
usecases\cem\evsoc\public_test.go
1 3 -
A
usecases\cem\evsoc\types.go
 3 -
A
usecases\cem\evsoc\usecase.go
4 3 -
A
usecases\cem\oscev\events.go
19 3 -
A
usecases\cem\evsoc\usecase_test.go
1 3 -
A
mocks\FeatureClientInterface.go
19 3 -