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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\vabd\events_test.go
3 4 1
A
usecases\cem\evsoc\events_test.go
3 4 -
A
mocks\DeviceDiagnosisServerInterface.go
2 4 -
A
mocks\ElectricalConnectionClientInterface.go
28 4 -
A
mocks\ElectricalConnectionCommonInterface.go
55 4 2
A
usecases\cem\evsoc\usecase.go
1 4 -
A
usecases\ma\mpc\types.go
 4 -
A
usecases\ma\mpc\public_test.go
7 4 1
A
usecases\ma\mgcp\usecase.go
1 4 -
A
usecases\cem\opev\events_test.go
4 4 1
A
features\internal\electricalconnection.go
73 4 -
A
mocks\LoadControlServerInterface.go
12 4 -
A
mocks\MeasurementClientInterface.go
21 4 -
A
features\client\deviceconfiguration_test.go
6 4 1
A
mocks\MeasurementServerInterface.go
12 4 -
A
mocks\TimeSeriesClientInterface.go
27 4 -
A
mocks\UseCaseBaseInterface.go
15 4 -
A
usecases\mocks\CemEVCEMInterface.go
37 4 -
A
mocks\UseCaseInterface.go
15 4 -
A
usecases\cem\vapd\usecase.go
1 4 -