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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cs\lpp\public_test.go
5 7 1
A
usecases\cs\lpp\events.go
47 7 1
A
usecases\cs\lpc\usecase.go
19 10 1
A
usecases\cs\lpc\events.go
47 7 1
A
usecases\cs\lpc\public_test.go
5 7 1
A
usecases\cem\vapd\events_test.go
4 4 1
A
usecases\cem\oscev\public_test.go
 9 1
A
usecases\cem\oscev\events_test.go
3 4 1
A
usecases\cem\vabd\events_test.go
3 4 1
A
usecases\cem\opev\public_test.go
 9 1
A
usecases\cem\opev\events_test.go
4 4 1
A
features\server\loadcontrol_test.go
6 5 1
A
features\client\deviceconfiguration_test.go
6 4 1
A
features\server\measurement_test.go
5 5 1
A
features\server\helper_test.go
3 3 1
A
features\server\electricalconnection_test.go
7 5 1
A
usecases\ma\mpc\public_test.go
7 4 1
A
usecases\cem\vapd\events.go
40 6 1
A
usecases\cem\evsecc\testhelper_test.go
4 7 1
A
features\server\devicediagnosis_test.go
4 5 1