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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\cevc\testhelper_test.go
4 7 2
A
usecases\cem\evcc\testhelper_test.go
4 7 2
A
usecases\cem\evcem\public_test.go
7 7 2
A
usecases\cem\evcem\testhelper_test.go
4 7 2
A
mocks\ElectricalConnectionCommonInterface.go
55 4 2
A
mocks\ElectricalConnectionServerInterface.go
80 5 2
A
usecases\cem\vabd\testhelper_test.go
4 8 2
A
usecases\cem\vapd\testhelper_test.go
4 7 2
A
usecases\cs\lpc\public.go
45 9 2
A
features\internal\helper_test.go
15 3 2
A
examples\ced\main.go
23 2 2
A
usecases\cs\lpp\public.go
45 10 2
A
usecases\eg\lpc\events_test.go
5 6 2
A
usecases\eg\lpc\testhelper_test.go
4 8 2
A
examples\controlbox\main.go
25 3 2
A
usecases\eg\lpp\events_test.go
5 6 2
A
usecases\eg\lpp\testhelper_test.go
4 8 2
B
usecases\internal\loadcontrol_test.go
14 9 3
A
usecases\cem\evsoc\testhelper_test.go
4 7 3
A
usecases\cem\opev\testhelper_test.go
5 8 3