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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\oscev\testhelper_test.go
5 9 -
A
mocks\IdentificationCommonInterface.go
9 3 -
A
usecases\cem\oscev\usecase.go
1 4 -
A
features\internal\devicediagnosis.go
 1 -
A
usecases\cem\vabd\events.go
31 6 -
A
features\internal\devicediagnosis_test.go
4 3 -
A
usecases\cem\vabd\public.go
14 2 -
A
usecases\cem\vapd\types.go
 3 -
A
usecases\cem\vabd\testhelper_test.go
4 9 -
A
mocks\IncentiveTableServerInterface.go
 3 -
A
usecases\cem\vabd\usecase.go
1 5 -
A
features\internal\electricalconnection.go
73 4 -
A
usecases\eg\lpc\events_test.go
 7 -
A
usecases\cs\lpp\usecase_test.go
 4 -
A
usecases\cs\lpp\public_test.go
 8 -
A
usecases\cem\vapd\public.go
18 2 -
A
examples\controlbox\main.go
49 5 -
A
features\client\electricalconnection.go
6 2 -
A
features\internal\loadcontrol_test.go
11 2 -
A
service\service_test.go
 14 -