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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\vapd\events_test.go
4 4 1
A
usecases\cem\evcc\testhelper_test.go
4 7 2
A
usecases\eg\lpp\usecase.go
4 5 -
A
usecases\cem\vabd\public_test.go
4 3 -
A
usecases\cem\evcem\events_test.go
4 4 -
A
usecases\cem\evcem\testhelper_test.go
4 7 2
A
usecases\usecase\usecase_test.go
4 5 -
A
usecases\usecase\testhelper_test.go
4 7 2
A
usecases\eg\lpp\testhelper_test.go
4 8 2
A
usecases\internal\helper_test.go
4 2 -
A
features\internal\deviceclassification_test.go
4 2 -
A
usecases\cem\opev\events_test.go
4 4 1
A
usecases\ma\mpc\testhelper_test.go
4 7 2
A
usecases\cem\evsoc\usecase.go
4 3 -
A
usecases\cem\evsoc\testhelper_test.go
4 7 3
A
features\client\deviceclassification_test.go
4 3 -
A
features\internal\devicediagnosis_test.go
4 3 -
A
usecases\cem\evsecc\testhelper_test.go
4 7 1
A
usecases\cs\lpp\usecase_test.go
3 3 -
A
usecases\cs\lpc\usecase_test.go
3 6 -