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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\opev\usecase.go
3 5 -
A
usecases\usecase\events_test.go
3 4 -
A
usecases\cem\oscev\events_test.go
3 4 1
A
usecases\cem\vabd\events_test.go
3 4 1
A
usecases\cem\oscev\usecase.go
3 5 -
A
usecases\ma\mpc\usecase.go
2 6 -
A
usecases\ma\mdt\usecase.go
2 1 -
A
usecases\ma\mgcp\usecase.go
2 5 -
A
usecases\ma\mdt\public_test.go
2 1 -
A
usecases\cem\cevc\public_scen1_test.go
2 3 -
A
usecases\cem\cevc\public_scen4_test.go
2 3 -
A
usecases\cem\cevc\public_scen58_test.go
2 1 -
A
usecases\cem\cevc\usecase.go
2 6 -
A
usecases\cem\vabd\usecase.go
2 6 -
A
usecases\cem\evcc\usecase.go
2 5 -
A
usecases\cem\evcem\usecase.go
2 5 -
A
usecases\cem\evsecc\public_test.go
2 3 -
A
usecases\cem\evsecc\usecase.go
2 5 -
A
mocks\DeviceDiagnosisServerInterface.go
2 4 -
A
usecases\cem\evsoc\usecase.go
2 5 -