dev
eebus-go
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Grade
Name
Complexity
Churn
Issues
A
mocks\TimeSeriesServerInterface.go
 3 -
A
usecases\api\cem_vapd.go
 1 -
A
features\internal\deviceclassification.go
 1 -
A
features\server\electricalconnection_test.go
 6 -
A
features\client\deviceclassification.go
 1 -
A
usecases\api\cem_evcc.go
 2 -
A
features\internal\devicediagnosis.go
 1 -
A
mocks\DeviceClassificationServerInterface.go
 3 -
A
api\configuration_test.go
 9 -
A
usecases\api\cs_lpp.go
 5 -
A
features\internal\helper.go
 2 -
A
features\internal\loadcontrol.go
 2 -
A
features\internal\identification.go
 1 -
A
features\server\loadcontrol_test.go
 6 -
A
usecases\api\ma_mgcp.go
 2 -
A
usecases\api\eg_lpp.go
 6 -
A
usecases\api\eg_lpc.go
 5 -
A
usecases\api\cs_lpc.go
 4 -
A
usecases\api\cem_evsecc.go
 2 -
A
mocks\IncentiveTableServerInterface.go
 3 -