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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\cem\cevc\public_scen1.go
33 3 -
A
usecases\cem\cevc\public_scen3.go
33 2 -
A
examples\hems\main.go
34 3 -
B
features\internal\electricalconnection_test.go
34 5 3
A
usecases\usecase\events.go
34 3 -
A
mocks\MeasurementCommonInterface.go
34 3 -
A
usecases\ma\mpc\public.go
34 3 -
A
usecases\mocks\CemVABDInterface.go
35 4 -
A
usecases\cem\cevc\public_scen2.go
35 3 -
A
mocks\ServiceInterface.go
35 12 -
A
usecases\mocks\CemEVCEMInterface.go
37 4 -
A
usecases\ma\mpc\events.go
37 6 -
A
usecases\cem\evcem\events.go
37 6 -
A
usecases\cem\evcem\public.go
40 7 -
A
usecases\cem\vapd\events.go
40 6 1
A
usecases\cem\cevc\public_scen4.go
41 2 -
A
usecases\mocks\CemOSCEVInterface.go
42 5 -
A
usecases\mocks\CemOPEVInterface.go
42 5 -
A
mocks\DeviceConfigurationServerInterface.go
42 3 -
A
usecases\ma\mgcp\public.go
44 2 -