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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
features\server\electricalconnection_test.go
 6 -
A
features\server\loadcontrol_test.go
 6 -
A
usecases\cem\evcc\events.go
66 6 -
A
features\server\measurement_test.go
 6 -
A
usecases\cem\evcem\events.go
37 6 -
A
usecases\cem\evsoc\events.go
12 6 -
A
usecases\ma\mgcp\testhelper_test.go
4 6 -
A
usecases\cem\vabd\events.go
31 6 -
A
usecases\cem\vapd\events.go
40 6 1
A
usecases\mocks\EgLPCInterface.go
60 6 -
A
usecases\internal\testhelper_test.go
3 6 -
A
usecases\mocks\EgLPPInterface.go
60 6 -
A
usecases\mocks\CsLPPInterface.go
55 6 -
A
usecases\ma\mgcp\events.go
46 6 1
A
usecases\cs\lpp\types.go
 6 -
A
usecases\eg\lpc\usecase.go
1 6 -
A
usecases\eg\lpp\events_test.go
5 6 2
A
usecases\ma\mpc\events.go
39 7 -
A
examples\hems\main.go
47 7 -
A
integration_tests\helper_test.go
24 7 -