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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\eg\lpp\public_test.go
 7 3
A
usecases\cs\lpc\events_test.go
4 5 3
A
usecases\eg\lpc\public_test.go
 7 3
A
features\internal\electricalconnection_test.go
34 5 3
A
usecases\cs\lpp\events_test.go
4 5 3
A
usecases\eg\lpp\events_test.go
5 6 2
A
usecases\cem\evcem\public_test.go
7 7 2
A
usecases\cs\lpp\public.go
46 11 2
A
mocks\ElectricalConnectionServerInterface.go
80 5 2
A
usecases\cs\lpc\public.go
46 10 2
A
features\internal\helper_test.go
15 3 2
A
features\client\helper_test.go
15 4 2
A
mocks\ElectricalConnectionCommonInterface.go
55 4 2
A
usecases\cem\vapd\events.go
40 6 1
A
usecases\cem\vapd\events_test.go
4 4 1
A
usecases\cem\vabd\events_test.go
3 4 1
A
usecases\cs\lpc\events.go
47 7 1
A
usecases\cem\oscev\public_test.go
 9 1
A
usecases\cem\oscev\events_test.go
3 4 1
A
usecases\cs\lpc\usecase.go
23 12 1