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eebus-go
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Grade
Name
Complexity
Churn
Issues
A
usecases\api\ma_mdt.go
 1 -
A
usecases\internal\loadcontrol_test.go
8 11 -
A
features\server\devicediagnosis.go
4 2 -
A
usecases\internal\manufacturerdata_test.go
1 2 -
A
usecases\api\ma_mpc.go
 1 -
A
usecases\internal\measurement_test.go
 5 -
A
features\client\identification.go
 1 -
A
usecases\ma\mdt\events.go
15 1 -
A
usecases\api\types.go
 6 -
A
usecases\ma\mdt\public.go
10 1 -
A
features\server\electricalconnection.go
38 4 -
A
usecases\mocks\CemVAPDInterface.go
32 5 -
A
usecases\mocks\CemVABDInterface.go
37 5 -
A
usecases\mocks\CemEVSECCInterface.go
28 6 -
A
usecases\ma\mpc\usecase.go
2 6 -
A
usecases\ma\mpc\events.go
39 7 -
A
usecases\ma\mdt\usecase_test.go
 1 -
A
.mockery.yaml
 4 -
A
features\internal\loadcontrol_test.go
11 2 -
A
usecases\cs\lpp\usecase_test.go
 4 -